Neave effect also occurs with Tausworthe sequences
Shu Tezuka
WSC 1991
Capacitive crosstalk and TFT photoleakage affect the transmission-voltage array characteristics in high-resolution TFTLCDs. These effects depend upon the drive inversion scheme used, and are image-dependent. Photoleakage can also be a cause of flicker in TFTLCDs at low frame rates. One characterization method utilizes comparison of front-of-screen measurements with either measured test cells or theoretical cell characteristics. A second method utilizes digital crosstalk compensation, in which the image data provided to the panel is modified to offset the effects of crosstalk in various test image patterns.
Shu Tezuka
WSC 1991
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
George Markowsky
J. Math. Anal. Appl.
D.S. Turaga, K. Ratakonda, et al.
SCC 2006