Conference paper
Optimizing history effects in 65nm PD-SOI CMOS
Q. Liang, T. Kawamura, et al.
IEEE International SOI Conference 2006
Paper
Magnetic hysteresis in integrated low Tc SQUID gradiometers
Abstract
We have measured the magnetic hysteresis of thin-film superconducting gradiometers. The fractional hysteresis error h was found to be about 10 -9-10-11 in several devices.
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