IEEE Transactions on Pattern Analysis and Machine Intelligence

Machine Vision Algorithms for Automated Inspection of Thin-Film Disk Heads

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This paper deals with the problem of digital visual inspection of thin-film disk heads. We will present machine vision algorithms and a supporting architecture that are integrated in a fully automated prototype system for disk head inspection. We will also elaborate on some specific methods, such as computation of the Hough transform and multicode masks in pipeline architectures, object segmentation in textured backgrounds, and matching of extracted defects with inspection specifications. Extensive experimented results will also be given. © 1988 IEEE