About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Ultramicroscopy
Paper
Low-temperature compatible I-V converter
Abstract
A novel design of a current-to-voltage (I-V) converter is described that shows a superior bandwidth and signal-to-noise ratio. It solves the problem of the nonuniform transfer function in the feedback loop of I-V converters with measuring resistors larger than 1 GΩ. The input stage including four junction field effect transistors (FET) and the linearized measuring resistor have been integrated into a single TO-8 housing. Since junction FET's are not dependent on minority carriers, they can be operated at variable temperature with no degradation of performance. The signal-to-noise ratio is improved when the preamplifier can be cooled down to liquid nitrogen temperature or lower. The preamplifier needs five connections to the main stage, one of which is the signal ground. Even with a large separation between the preamplifier and the main stage, the bandwidth exceeds 1 MHz. © 1992.