E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
A semiquantitative technique for estimating the limits of the critical current density in polycrystalline high-temperature superconductors is presented. This technique is based on the transport properties of single grain boundaries. Various factors essential in deducing the critical current density of polycrystalline high-Tc materials from the characteristics of single grain boundaries are discussed. The results for tectured, polycrystalline YBa2Cu3O7 fibers are reported, and the influence of the microstructure on their critical current density is discussed. © 1989 Springer-Verlag.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science