Conference paper
The resilience wall: Cross-layer solution strategies
Subhasish Mitra, Pradip Bose, et al.
VLSI-TSA 2014
As scaling threatens to erode reliability standards, lifetime reliability must become a first-class design constraint. Microarchitectural intervention offers a novel way to manage lifetime reliability without significantly sacrificing cost and performance. © 2005 IEEE.
Subhasish Mitra, Pradip Bose, et al.
VLSI-TSA 2014
Jayanth Srinivasan, Sarita V. Adve, et al.
DSN 2004
Gokul Subramanian Ravi, Ramon Bertran, et al.
ISPASS 2021
Alper Buyuktosunoglu, Tejas Karkhanis, et al.
ISCA 2003