Conference paper
Convergence properties of multi-dimensional stack filters
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
Two new methods for attaining convergence in self-consistent field calculations are described. They have been applied to semiconductor inversion layers at finite temperature. © 1970.
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
W.C. Tang, H. Rosen, et al.
SPIE Optics, Electro-Optics, and Laser Applications in Science and Engineering 1991
Ziv Bar-Yossef, T.S. Jayram, et al.
Journal of Computer and System Sciences
Imran Nasim, Melanie Weber
SCML 2024