Conference paper
Single and dual wavelength exposure of photoresist
J. LaRue, C. Ting
Proceedings of SPIE 1989
We briefly review recent progress in elucidating the time-independent critical behavior of systems with infinite numbers of static absorbing states, and show that the critical exponent describing the decay with time of the order parameter right at the critical point is the same as that of the directed percolation problem.
J. LaRue, C. Ting
Proceedings of SPIE 1989
Ronen Feldman, Martin Charles Golumbic
Ann. Math. Artif. Intell.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
M. Shub, B. Weiss
Ergodic Theory and Dynamical Systems