Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Inelastic-electron-scattering measurements from Si(111)-7×7 and thin metal films on Si(111) are obtained for several different temperatures and analyzed with use of dipole scattering theory. A detailed discussion of the shape and temperature dependence of the quasielastic peak is presented. In particular, we show how the temperature-dependent width of the quasielastic peak can be used to obtain information regarding the surface free-carrier density, surface effective mass, and the surface conductivity. Analysis of the Si(111)-7×7 surface suggests an unusual surface electronic structure where a narrow state occurs within a surface-state band gap and determines the Fermi-level position. Analysis of Au and Pd metal films on Si(111) allows us to determine film resistivities as well as delineate microstructural features which influence surface transport properties. © 1984 The American Physical Society.
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter