Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
We report measurements of the optic index of reflection as a function of temperature, n(T), for several highly disordered ferroelectrics: PLZT ceramic [Pb1-xLax(Zr0.65Ti0.35)1-x/4O3 where x = 0.08] and single crystals of Pb3(MNb2)O9 where M = Zn and Mg. The results are qualitatively different from the unusual displacive ferroelectric behavior and the difference is clearly due to local disorder. © 1973.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Robert W. Keyes
Physical Review B
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Surface Science
J.H. Stathis, R. Bolam, et al.
INFOS 2005