In Situ X-Ray Absorption Study of Chromium Valency Changes in Passive Oxides on Sputtered ALCr Thin Films Under Electrochemical Control

Paper

07 Dec 2019

In Situ X-Ray Absorption Study of Chromium Valency Changes in Passive Oxides on Sputtered ALC_r Thin Films Under Electrochemical Control

No abstract available.

Paper

Hiroshi Ito, Reinhold Schwalm

JES

Paper

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Conference paper

Kafai Lai, Alan E. Rosenbluth, et al.

SPIE Advanced Lithography 2007

Paper

J.K. Gimzewski, T.A. Jung, et al.

Surface Science