D. Arnold, E. Cartier, et al.
SPIE Laser-Induced Damage in Optical Materials 1990
We have developed an electron lithography method, hot electron emission lithography, which is capable of printing integrated circuits with an exposure time of only a few seconds. The basic design and fabrication of the patterned electron emitting mask made by standard metal-oxide-semiconductor technology will be discussed, and its applicability in a simple 1:1 e-beam stepper will be demonstrated. Patterns with a minimum feature size of 160 nm have been printed successfully. Further improvements in resolution to 50 nm appear to be possible. © 1998 American Institute of Physics.
D. Arnold, E. Cartier, et al.
SPIE Laser-Induced Damage in Optical Materials 1990
S. Guha, E. Cartier, et al.
Journal of Applied Physics
R.E. Stahlbush, E. Cartier
IEEE TNS
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IRPS 2009