Microscopy and Microanalysis

Paper

24 Jul 2003

High resolution spectrometer coupling to the sub-Å IBM STEM

Abstract

No abstract available.

Paper

Surface plasmon scattering on flat surfaces at grazing incidence

P.E. Batson

Ultramicroscopy

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Electronic structure in confined volumes using spatially resolved electron energy loss scattering

P.E. Batson

Materials Science and Engineering B

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Characterizing probe performance in the aberration corrected STEM

P.E. Batson

Ultramicroscopy

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Electron energy loss spectroscopy of single silicon nanocrystals: The conduction band

P.E. Batson, J.R. Heath

Physical Review Letters

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