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ACS Nano
The instrumental requirements, spectral processing and interpretation for spatially resolved electron energy loss scattering appropriate for electronic structure determinations are reviewed. As an example, the recent Si L2, 3 absorption spectra obtained with 0.2 eV resolution in GeSi alloy layers 5-50 nm thick are discussed. © 1992.
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
John G. Long, Peter C. Searson, et al.
JES
R. Ghez, M.B. Small
JES
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997