Critical parameters for current-induced domain wall motion
M. Kläui, P.O. Jubert, et al.
INTERMAG 2005
A simple technique is presented which allows a very small spin polarization to be distinguished from a vanishing one in spin polarized scanning electron microscopy (spin-SEM). Ferromagnetic thin films are evaporated through a mask onto a nonmagnetic substrate, thus producing a patterned area. Spin polarization and the element specificity of the secondary electron yield are combined to determine a local]] asymmetry zero" where the spin polarization vanishes. With this technique it is possible to distinguish between a single domain thin film and a nonmagnetic one in spin-SEM. This is exemplified by monolayer Co/Cu (100) films.
M. Kläui, P.O. Jubert, et al.
INTERMAG 2005
M. Kläui, P.O. Jubert, et al.
Physical Review Letters
W. Weber, C.H. Back, et al.
Nature
D. Kerkmann, D. Pescia, et al.
Physical Review Letters