R. Allenspach
Journal of Magnetism and Magnetic Materials
A simple technique is presented which allows a very small spin polarization to be distinguished from a vanishing one in spin polarized scanning electron microscopy (spin-SEM). Ferromagnetic thin films are evaporated through a mask onto a nonmagnetic substrate, thus producing a patterned area. Spin polarization and the element specificity of the secondary electron yield are combined to determine a local]] asymmetry zero" where the spin polarization vanishes. With this technique it is possible to distinguish between a single domain thin film and a nonmagnetic one in spin-SEM. This is exemplified by monolayer Co/Cu (100) films.
R. Allenspach
Journal of Magnetism and Magnetic Materials
W. Weber, A. Bischof, et al.
Physical Review Letters
R. Allenspach, A. Bischof
Physical Review Letters
R. Allenspach, W. Weber
IBM J. Res. Dev