T.R. McGuire, D. Dimas, et al.
IEEE Transactions on Magnetics
In this letter we determine the theoretical limit of the magnetic-field sensitivity of the flux-gate magnetometer. In order to do so, we have developed a model for the white noise of a flux gate based on the fundamental dynamics of the magnetic material forming the flux-gate core. Solving this model, we predict that the white noise of a physically realizable flux gate with a volume of 2 X 10-8 m3 is less than 100 fT/√HZ. The white noise varies with the lossy susceptibility of the core and inversely with the volume. We also compare the measured white noise of a thin-film flux gate with the predictions of our model and find that the measured and predicted noise agree reasonably well. © 1999 American Institute of Physics.
T.R. McGuire, D. Dimas, et al.
IEEE Transactions on Magnetics
G. Grinstein, Terence Hwa, et al.
Physical Review A
G. Grinstein, C. Jayaprakash
Physical Review B
T. Bohr, G. Grinstein, et al.
Physical Review A