Fluctuations in the temperature dependence of the resistance of a one-dimensional system

Abstract

New effects are predicted to occur in the resistance of a one-dimensional system when the inelastic scattering time becomes longer than the transit time of a carrier through the system. While the mean behavior of R(T) is the same as in the multiple-hopping regime, the fluctuations in R(T) change dramatically, depending logarithmically on the length. The behavior of R(T) can give a detailed reconstruction of the microscopic eigenstates of the system. © 1983 The American Physical Society.