P. Alnot, D.J. Auerbach, et al.
Surface Science
Localization in semimetals and semiconductors strongly depends on the character of disorder. The resistance may decrease when the concentration of vacancies increases, and may be anomalously low for small size substitutions. © 1983.
P. Alnot, D.J. Auerbach, et al.
Surface Science
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Thin Solid Films