Leendert M. Huisman
Journal of Electronic Testing
No abstract available.
Leendert M. Huisman
Journal of Electronic Testing
Cheryl L. Morris, Gabriel M. Silberman
FIE 2003
Zeev Barzilai, Jacob Savir, et al.
IEEE TC
Gabriel M. Silberman, Ilan Y. Spillinger
Integration, the VLSI Journal