PaperA backtracing-oriented procedure for the analysis of combinational gate-level designsGabriel M. Silberman, Ilan Y. SpillingerIntegration, the VLSI Journal
Conference paperProgramming contests in academic environmentsCheryl L. Morris, Gabriel M. SilbermanFIE 2003
PaperExhaustive Generation of Bit Patterns with Applications to VLSI Self-TestingZeev Barzilai, Don Coppersmith, et al.IEEE TC