Leendert M. Huisman
Journal of Electronic Testing
No abstract available.
Leendert M. Huisman
Journal of Electronic Testing
Gabriel M. Silberman, Ilan Y. Spillinger
Integration, the VLSI Journal
Zeev Barzilai, Jacob Savir, et al.
IEEE TC
Zeev Barzilai, J. Lawrence Carter, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems