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Publication
IEEE Design and Test of Computers
Paper
The reliability of approximate testabilty measures
Abstract
There are several techniques for gauging the accuracy of approximate testability measures. The measures described here estimate the random-pattern testability of gate-level faults in designs with combinational logic. The author examines three measures of testability: Overall fault-exposure distribution, high coverage, and fault grading. Sampling techniques are compared with the Stafan and Protest approximate testability measures. © 1988 IEEE