M.S. Goorsky, Subramanian S. Iyer, et al.
Applied Physics Letters
The reliability of molten KOH for revealing dislocations intersecting {100} faces of GaAs has been tested using transmission x-ray topography. It is found to be a "faithful" etch.
M.S. Goorsky, Subramanian S. Iyer, et al.
Applied Physics Letters
T.S. Plaskett, P. Fumagalli, et al.
IEEE Transactions on Magnetics
T.F. Kuech, R.M. Potemski, et al.
Journal of Electronic Materials
E.A. Giess, R.L. Sandstrom, et al.
IBM J. Res. Dev