Publication
IEEE ICC 2015
Conference paper

Endurance limits of MLC NAND flash

View publication

Abstract

An extensive effort is being undertaken by the flash community to develop signal processing and error-correction coding schemes that make use of soft information. Using experimental data from a state-of-the-art MLC flash device we demonstrate that the theoretical endurance improvement that such schemes can bring is limited. To investigate further, we develop a parametric channel model that takes into account the effects of cell-to-cell interference and demonstrate that it is the presence of programming errors in the channel that restricts the potential endurance enhancement that soft information can offer.

Date

09 Sep 2015

Publication

IEEE ICC 2015

Authors

Share