J.D. Mis, S. Mader, et al.
Journal of Applied Physics
Paper
Elektronenmikroskopische Beobachtungen von Versetzungen in Germanium
Abstract
No abstract available.
Related
Alwin E. Michel, R.H. Kastl, et al.
Applied Physics Letters
Conference paper
DEFECTS IN SILICON FILMS GROWN BY EPITAXIAL LATERAL OVERGROWTH.
B.J. Ginsberg, M. Arienzo, et al.
ECS Meeting 1983
E. Rimini, W.K. Chu, et al.
Journal of Applied Physics