PaperMethod for examining solid specimens with improved resolution in the scanning electron microscope (SEM)O.C. Wells, A.N. Broers, et al.Applied Physics Letters
PaperPhase-slip and localization diffusion lengths in amorphous W-Re alloysP. Chaudhari, A.N. Broers, et al.Physical Review Letters
PaperHigh‐resolution surface scanning electron microscopy of mineralized tissuesA. Boyde, A.N. BroersJournal of Microscopy
