John G. Long, Peter C. Searson, et al.
JES
No abstract available.
John G. Long, Peter C. Searson, et al.
JES
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
J. Tersoff
Applied Surface Science
H.D. Dulman, R.H. Pantell, et al.
Physical Review B