R.H. Geiss, T.C. Huang
X‐Ray Spectrometry
A method of obtaining rocking-beam microarea electron diffraction patterns is described employing the electron optics of a single-field condenser-objective lens in a commercial scanning transmission electron microscope. Theoretical and experimental evidence is presented showing that it is possible to obtain diffraction patterns from areas less than 3 nm in diameter with minimum lattice spacings of 0.14 nm. This is demonstrated with a specimen consisting of small gold particles evaporated on a carbon substrate.
R.H. Geiss, T.C. Huang
X‐Ray Spectrometry
J.C. Suits, R.H. Geiss, et al.
Applied Physics Letters
P.S. Alexopoulos, R.H. Geiss
IEEE Transactions on Magnetics
W.D. Gill, W. Bludau, et al.
Physical Review Letters