Julien Autebert, Aditya Kashyap, et al.
Langmuir
This paper presents a review of electron‐sensitive resists evaluated for electron beam exposure. This includes positive as well as negative resists and their relative merits and drawbacks. The paper also presents general guidelines that can be used in evaluating any electron resist system for performance and usefulness in electron beam microfabrication. Copyright © 1974 Society of Plastics Engineers, Inc.
Julien Autebert, Aditya Kashyap, et al.
Langmuir
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MRS Spring 2000
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983