Publication
ISLPED 2003
Conference paper

Efficient Techniques for Gate Leakage Estimation

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Abstract

Gate leakage current is expected to be the dominant leakage component in future technology generations. In this paper, we propose methods for steady-state gate leakage estimation based on state characterization. An efficient technique for pattern-dependent gate leakage estimation is presented. Further, we propose the use of this technique for estimating the average gate leakage of a circuit using pattern-independent probabilistic analysis. Results on a large set of benchmark ISCAS circuits show an accuracy within 5% of SPICE results with 500X to 50000X speed improvement.

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Publication

ISLPED 2003

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