Frank Stem
C R C Critical Reviews in Solid State Sciences
Smeared transitions into low-T domain states are evidenced by linear birefringence measured on Srl-xCaxTiO3 at all concentrations, ˂0.002˂x˂0.058. Sharp E vs T peaks, as observed for x 0.016, may be explained by domains having nearly sample size. The local disorder due t o the Ca2+-induced random fields may pa rtially be removed by a uniform external electric field. © 1988, Taylor & Francis Group, LLC. All rights reserved.
Frank Stem
C R C Critical Reviews in Solid State Sciences
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
A. Gangulee, F.M. D'Heurle
Thin Solid Films