Publication
CLEO 2016
Conference paper

Distributed backscattering due to stochastic defects in production O-band Si photonic waveguides

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Abstract

We report backscattering of -19 to -36 dB per 1mm of waveguide length. We find the dependence of backscattering intensity on waveguide geometry and polarization to be consistent with backscattering being dominated by sidewall defects.

Date

16 Dec 2016

Publication

CLEO 2016

Authors

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