About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
NSTI-Nanotech 2012
Conference paper
Discreteness and distribution of drain currents in FinFETs
Abstract
We first show the discreteness of source-node and drain-node voltages of individual fins in a multi-fin multi-gate CMOS FET and show their distributions. We then present the discreteness and distributions of individual fin's drain currents, conductances, gate leakage currents, and capacitances.