Publication
Superlattices and Microstructures
Paper

Diffuse and abrupt interface formation studied by high resolution electron energy loss spectroscopy

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Abstract

Long wavelength interface optical phonons measured by HREELS are used to characterize interfaces between different dielectric materials. Four cases are presented: (1) a diffuse interface SiO2Si(100); (2) an epitaxial abrupt interface: CaF2Si(111); (3) an epitaxial reactive interface: AlSbSb(111); (4) an epitaxial periodic interface in a GaAsAlGaAs superlattice. Complementary information about the chemical structure of the first three interfaces is given by synchrotron radiation induced photoemission. © 1990.

Date

01 Jan 1990

Publication

Superlattices and Microstructures

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