Conference paper
Single wafer sSOI by SIMOX
J.P. De Souza, S.W. Bedell, et al.
ISTDM 2006
Evidence is presented to show that the degradation of near-band-gap photoluminescence emission in GaAs with time of exposure to low power, cw laser excitation can be attributed to a surface mechanism that is independent of surface oxidation and may involve an interaction between crystal point defects and the photogenerated electron-hole plasma near the surface.
J.P. De Souza, S.W. Bedell, et al.
ISTDM 2006
H.J. Hovel
Semiconductor Science and Technology
S.W. Bedell, H.J. Hovel, et al.
ECS Meeting 2005
H.J. Hovel, R.T. Hodgson, et al.
IEEE T-ED