Conference paper
0.22 μm CMOS-SOI technology with a Cu BEOL
A. Ajmera, J. Sleight, et al.
VLSI Technology 1999
Evidence is presented to show that the degradation of near-band-gap photoluminescence emission in GaAs with time of exposure to low power, cw laser excitation can be attributed to a surface mechanism that is independent of surface oxidation and may involve an interaction between crystal point defects and the photogenerated electron-hole plasma near the surface.
A. Ajmera, J. Sleight, et al.
VLSI Technology 1999
M. Eizenberg, A.C. Callegari, et al.
Applied Physics Letters
D. Guidotti
Review of Progress in Quantitative Nondestructive Evaluation
H.J. Hovel, J.J. Cuomo
Applied Physics Letters