B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
Paper
Data-driven self-timed RSFQ high-speed test system
Abstract
Functional testing of rapid single-flux-quantum (RSFQ) logic circuits at high speed is necessary to further optimize circuit design, but it is not easy to do off-chip testing because of the high speed and small amplitude of SFQ pulses. This paper will present the design and test results of an 20 Gb/s bit-by-bit on-chip high-speed digital test system based on data-driven self-timed (DDST) circuits. © 1997 IEEE.
Related
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990