J.A. Barker, D. Henderson, et al.
Molecular Physics
Functional testing of rapid single-flux-quantum (RSFQ) logic circuits at high speed is necessary to further optimize circuit design, but it is not easy to do off-chip testing because of the high speed and small amplitude of SFQ pulses. This paper will present the design and test results of an 20 Gb/s bit-by-bit on-chip high-speed digital test system based on data-driven self-timed (DDST) circuits. © 1997 IEEE.
J.A. Barker, D. Henderson, et al.
Molecular Physics
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
R. Ghez, M.B. Small
JES