I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
The structure and crystallization behavior of Te85Ge15, Te81Ge15Sb4, and Te81Ge15As4 glasses has been investigated by transmission electron microscopy. The vapor deposited films showed coherently scattering regions of 15-25 Å. On subsequent heating, crystalline tellurium appeared followed by cubic or distorted cubic GeTe. An intermediate phase was detected in the Te81Ge15Sb4 phase. These results are discussed in terms of the thermodynamics of amorphous to crystalline transformation. © 1972.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
J.C. Marinace
JES
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
T.N. Morgan
Semiconductor Science and Technology