Jonathan Z. Sun, R.P. Robertazzi, et al.
DRC 2011
The ability to electrically characterize submicron magnetic tunnel junctions (MTJ) using a conducting atomic force microscopy (CAFM) was discussed. The brief processing was found to save time and resources, and reduced the potential for damage to the MTJs. The sample requirements, CAFM processing route and the tip preparation were also elaborated.
Jonathan Z. Sun, R.P. Robertazzi, et al.
DRC 2011
David W. Abraham, C.C. Williams, et al.
Applied Physics Letters
Tai Min, Qiang Chen, et al.
IEEE Transactions on Magnetics
D.C. Worledge, G. Hu, et al.
Journal of Applied Physics