PaperAnalysis of formation of hafnium silicide on siliconC.J. Kircher, J.W. Mayer, et al.Applied Physics Letters
PaperThermal stability of Pd2Si and PdSi in thin film and in bulk diffusion couplesK.N. TuJournal of Applied Physics
PaperSingle intermetallic compound formation in Pd-Pb and Pd-Sn thin-film couples studied by X-ray diffractionK.N. TuMaterials Letters
