J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
ESD robustness of 4 kV HBM is achieved in CMOS-on-SOI ESD protection networks in an advanced sub-0.25 μm mainstream CMOS-on-SOI technology. Design layout, body contact, floating-gate effects and novel ESD protection implementations are discussed. © 1998 Elsevier Science B.V.
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Lawrence Suchow, Norman R. Stemple
JES
Mark W. Dowley
Solid State Communications
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS