Lawrence Suchow, Norman R. Stemple
JES
A CMOS compatible process for the cost-efficient fabrication of SOI grating couplers is presented. Test devices have been fabricated and characterized in a fully automated measurement setup at telecom wavelength (1550 nm). Coupling efficiencies of -3.6 and -4.1 dB have been achieved for TE and TM polarization, respectively. The 3 dB bandwidth has been measured to be about 50 nm. © 2008 Elsevier B.V. All rights reserved.
Lawrence Suchow, Norman R. Stemple
JES
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Hiroshi Ito, Reinhold Schwalm
JES
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry