Characterization of transient error tolerance for a class of mobile embedded applications

Abstract

We study the inherent resilience (to transient errors) of a class of embedded applications that are currently under study in the DARPA-sponsored program called PERFECT. The experimental setup used in this research uses a fast fault-injection methodology, that takes advantage of native execution speeds on actual system hardware. The reported resilience characterization data are interpreted in the context of measured workload metrics like dynamic instruction frequency mix.