Intra-system interconnects for digital communications
A. Deutsch, G. Arjavalingam, et al.
ECTC 1994
A method for completely characterizing resistive transmission lines by short-pulse propagation is described. Using the loss and dispersion of pulses propagated on two different lengths of line, together with the measured low-frequency capacitance, the frequency-dependent propagation constant, attenuation, and the complex impedance are determined. The basic method is demonstrated with results from low-loss cables and a well-controlled coplanar waveguide sample. © 1992, IEEE. All rights reserved.
A. Deutsch, G. Arjavalingam, et al.
ECTC 1994
G. Almasi, G. Almasi, et al.
Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Y. Pastol, G. Arjavalingam, et al.
Electronics Letters
A. Deutsch, M. Swaminathan, et al.
IEEE Topical Meeting EPEPS 1993