P.C. Pattnaik, D.M. Newns
Physical Review B
Black phosphorus is a layered semiconductor that is intensely researched in view of applications in optoelectronics. In this letter, we investigate a multilayer black phosphorus photodetector that is capable of acquiring high-contrast (V > 0.9) images both in the visible (VIS = 532 nm) as well as in the infrared (IR = 1550 nm) spectral regime. In a first step, by using photocurrent microscopy, we map the active area of the device and we characterize responsivity and gain. In a second step, by deploying the black phosphorus device as a point-like detector in a confocal microsope setup, we acquire diffraction-limited optical images with submicron resolution. The results demonstrate the usefulness of black phosphorus as an optoelectronic material for hyperspectral imaging applications.
P.C. Pattnaik, D.M. Newns
Physical Review B
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
J.A. Barker, D. Henderson, et al.
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