N. García, A.M. Baró, et al.
Metrologia
The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 A and a vertical resolution less than 1 A. © 1986 The American Physical Society.
N. García, A.M. Baró, et al.
Metrologia
M. Bammerlin, R. Lüthi, et al.
Applied Physics A: Materials Science and Processing
E. Delamarche, Bruno Michel, et al.
Langmuir
Y. Watanabe, J.G. Bednorz, et al.
Applied Physics Letters