G. Binnig, Ch. Gerber, et al.
Surface Science
Paper
Atomic resolution with atomic force microscope
Abstract
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å. © 1987 IOP Publishing Ltd.
Related
M. Baumberger, E. Stoll, et al.
Physical Review B
T. Schneider, E. Stoll
Physical Review Letters
G. Binnig, H. Fuchs, et al.
Surface Science