Publication
EPL
Paper

Atomic resolution with atomic force microscope

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Abstract

The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å. © 1987 IOP Publishing Ltd.

Date

25 Jul 2007

Publication

EPL

Authors

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