R. Ghez, J.S. Lew
Journal of Crystal Growth
We present structural studies of coevaporated thin In-Ge films. At high thicknesses they show random percolation structure. At low thicknesses no sharp percolation threshold is observed. Annealing induces the appearance of orientational clusters which span to a length scale of — 300 times the crystallite size. Their fractal dimension was found to be 1.65 + 0.1. © 1986 American Vacuum Society
R. Ghez, J.S. Lew
Journal of Crystal Growth
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Ming L. Yu
Physical Review B
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures