I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
We present structural studies of coevaporated thin In-Ge films. At high thicknesses they show random percolation structure. At low thicknesses no sharp percolation threshold is observed. Annealing induces the appearance of orientational clusters which span to a length scale of — 300 times the crystallite size. Their fractal dimension was found to be 1.65 + 0.1. © 1986 American Vacuum Society
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
P.C. Pattnaik, D.M. Newns
Physical Review B
J.K. Gimzewski, T.A. Jung, et al.
Surface Science