Abstract
We present structural studies of coevaporated thin In-Ge films. At high thicknesses they show random percolation structure. At low thicknesses no sharp percolation threshold is observed. Annealing induces the appearance of orientational clusters which span to a length scale of — 300 times the crystallite size. Their fractal dimension was found to be 1.65 + 0.1. © 1986 American Vacuum Society