Christophe R. Tretz, C.T. Chuang, et al.
International Journal of Electronics
The design and performance characteristics of a 128X64 MOS transistor memory is given. The storage cell used operates with a low standby power, 0.1 mW. The memory operates with a 12-ns access time, 35-ns read cycle time, and a 60-ns write cycle time. Copyright © 1966 by The Institute of Electrical and Electronics Engineers, Inc.
Christophe R. Tretz, C.T. Chuang, et al.
International Journal of Electronics
A. Deutsch, G.V. Kopcsay, et al.
IEEE Topical Meeting EPEPS 1995
P. Pleshko, T.J. Thomas
IEEE Transactions on Magnetics
L.M. Terman, L.G. Heller
IEEE T-ED