Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
This paper presents a new approach to online control system tuning, based on worst-case design using semi-infinite optimization, together with a plant uncertainty identification scheme which this approach requires. Copyright © 1987 by The Institute of Electrical and Electronics Engineers, Inc.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Khaled A.S. Abdel-Ghaffar
IEEE Trans. Inf. Theory
G. Ramalingam
Theoretical Computer Science
Charles H. Bennett, Aram W. Harrow, et al.
IEEE Trans. Inf. Theory