F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
The temperature dependence (30K>T>400 mK) and magnetic field dependence (H<50 kG) of hopping conduction have been measured as a function of impurity concentration and surface electric field in a quasi-two-dimensional impurity band formed in the inversion layer of a sodium-doped Si metal-oxide-semiconductor field-effect transistor. We find that our observations can be accommodated by noninteracting, single-particle hopping models based on percolation theory in which the effect of Coulomb interactions between electrons on different sites is ignored. Our observations are not consistent with the existence of a Coulomb gap in the single-particle excitation spectrum, although the gap was expected to determine the conductivity under the conditions examined in these experiments. © 1986 The American Physical Society.
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
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Technical Digest-International Electron Devices Meeting
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science