Haikun Zhu, Chung-Kuan Cheng, et al.
IEEE Topical Meeting EPEPS 2007
An electrical probe based on specially designed coaxial tips is shown to have 24-GHz bandwidth. It can be used to test high-speed signal propagation on planar or nonplanar chip or package interconnection structures with signal/ground pads as small as 50 µm. The detailed fabrication procedure, characterization, and use of the probe are presented. A variation of the design has 500-Ω input impedance and a bandwidth of 19 GHz. © 1990 IEEE
Haikun Zhu, Chung-Kuan Cheng, et al.
IEEE Topical Meeting EPEPS 2007
Alina Deutsch, Howard H. Smith, et al.
IEEE Transactions on Advanced Packaging
Lijun Jiang, Chuan Xu, et al.
IEEE Transactions on Advanced Packaging
Yulei Zhang, Xiang Hu, et al.
SLIP 2009