Gerard V. Kopcsay, Byron Krauter, et al.
IEEE Transactions on VLSI Systems
An electrical probe based on specially designed coaxial tips is shown to have 24-GHz bandwidth. It can be used to test high-speed signal propagation on planar or nonplanar chip or package interconnection structures with signal/ground pads as small as 50 µm. The detailed fabrication procedure, characterization, and use of the probe are presented. A variation of the design has 500-Ω input impedance and a bandwidth of 19 GHz. © 1990 IEEE
Gerard V. Kopcsay, Byron Krauter, et al.
IEEE Transactions on VLSI Systems
Lijun Jiang, Seshadri Kolluri, et al.
EPEPS 2008
Albert X. Widmer, Kevin Wrenner, et al.
IEEE Journal of Solid-State Circuits
I.M. Elfadel, Alina Deutsch, et al.
IEEE Transactions on Advanced Packaging