Electrical characteristics of lossy interconnections for high-performance computer applications
- A. Deutsch
- G.V. Kopcsay
- et al.
- 1990
- SPIE Advances in Intelligent Robotics Systems 1990
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4 results for V.A. Ranieri
Electromigration of Ni in Al thin-film conductors
- F.M. D'Heurle
- A. Gangulee
- et al.
- 2008
- Journal of Applied Physics
A Novel 24-GHz Bandwidth Coaxial Probe
- Vincent A. Ranieri
- Alina Deutsch
- et al.
- 1990
- IEEE Trans. Instrum. Meas.
Effects of Mg additions on the electromigration behavior of Al thin film conductors
- F.M. d'Heurle
- A. Gangulee
- et al.
- 1975
- Journal of Electronic Materials